13 D18 Street, Hung Phu Residential Area, Phuoc Long B Ward, Thu Duc City, Ho Chi Minh City
Equipped with polycapillary X-ray focusing optics and a silicon drift detector, FT160 enables high preciseness and high throughput in nano-order level coating thickness measurement of electronic parts.
FT160 series is perfect for high precision, high throughput at nano-order level plating applied to minute electronic components. The FT160 carries a polycapillary optic system for a Ф30µm high-intensity primary X-ray beam (FWHM@17µm) paired with a high-performance semiconductor detector (SDD). The increased primary filter selection allows better performance control on the FT160 series, fulfilling even wider application scope such as ENIG, ENEPIG coating thickness measurement.
All FT160 models feature an HD camera and annular illumination to deliver optimal pinpoint positioning and lighting conditions. The new designed software that emphasis on user-friendliness is very capable to handle challenging coating thickness applications including gold (Au), silver (Ag), Tin (Sn) and electroness-Nickel (Ni-P).
Accomplishing highly precise measurement by irradiate high-luminance primary x-ray to the area of about 30 μmφ.
High count rate silicon drift detector enables highly precise measurement.
Precise multi-point automatic measurement function helps high efficiencies of the measurement.
Daily routine measurements can be conducted easily by using registered application-like recipe.
Adoption of closed housing greatly minimizes the risk of x-ray leakage. Wide door design improves visibility of the sample and operability of the instrument.